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A survey of particle contamination in electronic devices

Author
Adolphsen, J. W.
Published
Dec 1, 1976.
Physical Description
1 electronic document
Additional Creators
Kagdis, W. A. and Timmins, A. R.
Online Version

Availability

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Restrictions on Access
Unclassified, Unlimited, Publicly available.
Free-to-read Unrestricted online access
Summary
The experiences are given of a number of National Aeronautics and Space Administration (NASA) and Space and Missile System Organization (SAMSO) contractors with particle contamination, and the methods used for its prevention and detection, evaluates the bases for the different schemes, assesses their effectiveness, and identifies the problems associated with each. It recommends specific short-range tests or approaches appropriate to individual part-type categories and recommends that specific tasks be initiated to refine techniques and to resolve technical and application facets of promising solutions.
Other Subject(s)
Collection
NASA Technical Reports Server (NTRS) Collection.
Note
Document ID: 19770007395.
Accession ID: 77N14338.
X-311-76-266.
NASA-TM-X-71245.
Terms of Use and Reproduction
No Copyright.
View MARC record | catkey: 15733666