Long-life mission reliability for outer planet atmospheric entry probes
- Maycock, J. N.
- May 1, 1976.
- Physical Description:
- 1 electronic document
- Additional Creators:
- Rouch, L. and Mccall, M. T.
- hdl.handle.net , Connect to this object online.
- Restrictions on Access:
- Unclassified, Unlimited, Publicly available.
Free-to-read Unrestricted online access
- The results of a literature analysis on the effects of prolonged exposure to deep space environment on the properties of outer planet atmospheric entry probe components are presented. Materials considered included elastomers and plastics, pyrotechnic devices, thermal control components, metal springs and electronic components. The rates of degradation of each component were determined and extrapolation techniques were used to predict the effects of exposure for up to eight years to deep space. Pyrotechnic devices were aged under accelerated conditions to an equivalent of eight years in space and functionally tested. Results of the literature analysis of the selected components and testing of the devices indicated that no severe degradation should be expected during an eight year space mission.
- Other Subject(s):
- NASA Technical Reports Server (NTRS) Collection.
- Document ID: 19760021478.
Accession ID: 76N28566.
- No Copyright.
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