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The Purpose of Generating Fatigue Crack Growth Threshold Data

Author
Forth, Scott
Published
November 13, 2006.
Physical Description
1 electronic document
Online Version

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Unclassified, Unlimited, Publicly available.
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Summary
Test data shows that different width and thickness C(T), M(T) and ESE(T) specimens generate different thresholds Structures designed for "infinite life" are being re-evaluated: a) Threshold changes from 6 to 3 ksi in(sup 1/2); b) Computational life changes from infinite to 4 missions. Multi-million dollar test programs required to substantiate operation. Using ASTM E647 as standard guidance to generate threshold data is not practical. A threshold test approach needs to be standardized that will provide positive margin for high cycle fatigue applications.
Other Subject(s)
Collection
NASA Technical Reports Server (NTRS) Collection.
Note
Document ID: 20080031625.
ASTM Committee Meeting; 13-16 Nov. 2006; Atlanta, GA; United States.
Terms of Use and Reproduction
No Copyright.
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