Actions for Radiation Characterization of a 0.11 micrometer Modified Commercial CMOS Process

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Radiation Characterization of a 0.11 micrometer Modified Commercial CMOS Process

Author
Kim, H.
Published
[2006].
Physical Description
1 electronic document
Additional Creators
Mirabedini, M., Tung, J., Poivey, C., Vilchis, M., LaBel, K., Forney, J., Finlinson, R., Sukharnov, A., Song, J., Saigusa, R., Hornback, V., and Phan, A.
Online Version

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Restrictions on Access
Unclassified, Unlimited, Publicly available.
Free-to-read Unrestricted online access
Summary
This viewgraph presentation reviews the tests of a modified commercial CMOS chip for operation in radiation environments. The presentation has pictures of the chip, and charts of the test results.
Other Subject(s)
Collection
NASA Technical Reports Server (NTRS) Collection.
Note
Document ID: 20060027782.
2006 Single Event Effects Symposium (SEESYM); 10-12 Apr. 2006; Long Beach,CA; United States.
Terms of Use and Reproduction
Copyright, Distribution as joint owner in the copyright.
View MARC record | catkey: 16003366