The concept of designing for reliability will be introduced along with a brief overview of reliability, redundancy and traditional methods of fault tolerance is presented, as applied to current logic devices. The fundamentals of advanced circuit design and analysis techniques will be the primary focus. The introduction will cover the definitions of key device parameters and how analysis is used to prove circuit correctness. Basic design techniques such as synchronous vs asynchronous design, metastable state resolution time/arbiter design, and finite state machine structure/implementation will be reviewed. Advanced topics will be explored such as skew-tolerant circuit design, the use of triple-modular redundancy and circuit hazards, device transients and preventative circuit design, lock-up states in finite state machines generated by logic synthesizers, device transient characteristics, radiation mitigation techniques. worst-case analysis, the use of timing analyzer and simulators, and others. Case studies and lessons learned from spaceflight designs will be given as examples
