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Random testing of digital circuits : theory and applications / René David

Author: David, René, 1939-
Published: New York : Marcel Dekker, [1998]
Copyright Date: ©1998
Physical Description: xix, 475 pages : illustrations ; 24 cm

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Subject(s)

Digital integrated circuits—Testing

ISBN

0824701828 (alk. paper)

Bibliography Note

Includes bibliographical references (pages 447-461) and index.

View MARC record | catkey: 1617353