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Antenna Near-Field Probe Station Scanner

Author
Barr, Philip J.
Published
January 25, 2011.
Physical Description
1 electronic document
Additional Creators
Darby, William G., Lambert, Kevin M, Miranda, Félix A., Lee, Richard Q., and Zaman, Afroz J. M.
Online Version

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Unclassified, Unlimited, Publicly available.
Free-to-read Unrestricted online access
Summary
A miniaturized antenna system is characterized non-destructively through the use of a scanner that measures its near-field radiated power performance. When taking measurements, the scanner can be moved linearly along the x, y and z axis, as well as rotationally relative to the antenna. The data obtained from the characterization are processed to determine the far-field properties of the system and to optimize the system. Each antenna is excited using a probe station system while a scanning probe scans the space above the antenna to measure the near field signals. Upon completion of the scan, the near-field patterns are transformed into far-field patterns. Along with taking data, this system also allows for extensive graphing and analysis of both the near-field and far-field data. The details of the probe station as well as the procedures for setting up a test, conducting a test, and analyzing the resulting data are also described.
Other Subject(s)
Collection
NASA Technical Reports Server (NTRS) Collection.
Note
Document ID: 20110004229.
Terms of Use and Reproduction
No Copyright.
View MARC record | catkey: 16202468