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Conformance testing methodologies and architecture for OSI protocols / [edited by] Richard J. Linn, M. Ümit Uyar

Published
Los Alamitos, Calif. : IEEE Computer Society Press, 1994.
Physical Description
x, 527 pages : illustrations ; 29 cm
Additional Creators
Linn, Richard J. and Uyar, M. Ümit

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Subject(s)
ISBN
0818653523 (case)
0818653515 (fiche)
Bibliography Note
Includes bibliographical references and index.
View MARC record | catkey: 1656204