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High resolution X-ray diffractometry and topography / D. Keith Bowen and Brian K. Tanner

Author: Bowen, D. Keith (David Keith), 1940-
Published: London ; Bristol, PA : Taylor & Francis, [1998]
Copyright Date: ©1998
Physical Description: x, 252 pages : illustrations ; 28 cm
Additional Creators: Tanner, B. K. (Brian Keith)

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ISBN

0850667585

Bibliography Note

Includes bibliographical references and index.

View MARC record | catkey: 1679946