Actions for Reliable spectroradiometry
Reliable spectroradiometry / Henry J. Kostkowski
- Author
- Kostkowski, Henry J.
- Published
- La Plata, Md. : Spectroradiometry Consulting, 1997.
- Physical Description
- xii, 609 pages : illustrations ; 29 cm
- Contents
- NONLINEARITY: Measurement equation for a nonlinear spectroradiometer -- Inverse square law -- Beam attenuation with filters -- Beam addition -- Determining nonlinearity in spectral radiance measurements -- Other techniques for determining nonlinearity -- Recommendations for handling nonlinearity -- DIRECTIONAL AND POSITIONAL EFFECTS: The best solution is an averaging sphere -- Other possible solutions -- Experimental confirmation of directional and positional invariance of the responsivity -- Spectral radiance -- The Measurement equation for E[lambda] when R varies with direction and position -- Obtaining the correction term -- Directional and positional effects when measuring spectral radiance -- Recommendations for handling directional and positional effects -- SPECTRAL SCATTERING: The responsivity function -- A measurement equation that includes spectral scattering -- Simple example of a spectral scattering calculation -- Experimentally checking for scattered flux -- Estimating scattered flux before purchasing a spectroradiometer -- How to reduce spectral scattering -- Correction using the filter method -- Determination of the responsivity or the slit-scattering function -- Deconvolution -- Recommendations for handling spectral scattering --, SPECTRAL DISTORTION: Relative spectral data are Required -- When E[lambda]([lambda]) is linear over the central part of R([lambda]0[lambda]) -- A useful observable quantity when linearity only exists for the standard -- When E[lambda], has a spectral shape similar to E -- When E[lambda] consists of one isolated spectral Line -- When E[lambda]([lambda]) is an isolated spectral line plus a linear continuum -- When the spectral structure of E[lambda]([lambda]) is extensive or unknown -- When data can be taken at wavelength intervals equal to [delta][lambda]e -- Errors due to R being non-triangular and the sampling interval being different from [delta][lambda]e -- Taking data at a wavelength interval equal to [delta][lambda]e or [delta][lambda]e/2 when obtaining an estimate for E[lambda] -- Recommendations for handling spectral distortion -- POLARIZATION EFFECTS: A measurement equation that includes polarization effects -- Characterizing spectral radiance relative to polarization - stokes vector -- The polarizing properties of optical elements and instruments - Mueller matrices -- Derivation of a measurement equation including polarization effects -- Rough estimate of polarization effects -- Determination of polarization parameters using Mueller matrices for ideal optical components -- Determining the components of non-ideal Mueller matrices -- When the spectroradiometer can be rotated -- Stokes vector for tungsten lamps -- Recommendations for dealing with polarization effects -- SIZE-OF-SOURCE EFFECT: A Measurement equation that includes the size-of-source effect -- Determining the fraction of flux scattered by the fore-optics -- Recommendations for handling the size-of-source effect -- Figures and tables --, SPECTRAL IRRADIANCE STANDARDS: Uncertainties of the standards -- Modified type FEL lamp standards -- Deuterium lamp standards -- Argon Mini-Arcs -- SURF -- Detector standards -- Selecting a standard for spectral irradiance measurements -- Specialized standards -- SPECTRAL RADIANCE STANDARDS: Tungsten strip lamp -- Argon mini-arc -- Deuterium lamp -- Blackbodies -- Detector standards -- SURF -- Graphite arc -- WAVELENGTH STANDARDS: Factors to consider in selecting emission line wavelength standards -- Pencil discharge lamps -- Hollow cathode discharge lamps -- Electrodeless discharge lamps -- Other possible sources for wavelength standards -- FORE-OPTICS AND THE MONOCHROMATOR: Fore-optics -- Monochromators -- PHOTOMULTIPLIER DETECTORS: Noise equivalent Power -- Description of photomultipliers -- Wavelength range -- Signal-to-noise ratio -- Stability -- Linearity -- Uniformity -- Response time -- Power supply and output signal measurement -- Accessories and techniques for reduced noise and electrical interference -- Photon counting -- SILICON PHOTODIODES: Wavelength range -- Signal-to-noise ratio -- Selecting a photodiode and amplifier and calculating S/N -- Stability -- Linearity -- Uniformity -- Response time -- Comparison of silicon photodiodes and photomultipliers -- Procurement --, and GERMANIUM PHOTODIODES AND LEAD SULFIDE DETECTORS: Germanium photodiodes -- Lead sulfide detectors -- MULTICHANNEL DETECTORS: Advantages of multichannel detectors -- Photodiode arrays-PDA'S -- CCD detectors -- Intensified PDA's and CCD's -- Microchannel plate with resistive anode (MCP-RA) -- A major concern when using multichannel detectors -- Selecting a multichannel detector -- READOUT, AUTOMATION AND POSITIONING DEVICES: Readput devices -- Automation or computerized data acquisition and instrument control -- Optical tables, micropositioning devices and related accessories -- UNCERTAINTY: The CIPM approach -- Statistical concepts and methods -- Determining uncertainty in spectroradiometry -- THE MEASUREMENT PLAN: The Plan -- Outline for the remaining chapters -- GETTING STARTED: Description of quantity to be measured -- Potential errors -- Selecting an E[lambda] or L[lambda] standard -- Selecting a spectroradiometer -- Selecting a wavelength standard -- INSTRUMENT ASSEMBLY AND PRELIMINARY CHECKS: Establishing the optical axis -- Setting up the fore-optics -- Setting up the detectors -- Checking the output signal -- Checking the wavelength readout -- Figures and tables -- CHARACTERIZING THE SPECTRORADIOMETER: Measurement noise characterization -- Responsivity characterization -- Wavelength characterization -- Nonlinearity characterization -- Directional and positional characterization -- Spectral scattering characterization -- Spectral distortion characterization -- Polarization characterization -- MEASUREMENTS AND THE UNCERTAINTY REPORT: The measurement setup -- Characterizing the measurement setup -- The measurement design -- Taking and reducing the data -- Uncertainty report.
- Subject(s)
- ISBN
- 096577130X
- Bibliography Note
- Includes bibliographical references and index.
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