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Measurement and evaluation of the dielectric properties of low K (K<10) materials based on crystallographic considerations

Author:: Markowski, Kelley
Published:: [Place of publication not identified] : [publisher not identified], 1994.
Physical Description:: 111 leaves

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Related Titles:: Dielectric properties of low K (K<10) materials based on crystallographic considerations
Dissertation Note:: M.S. Pennsylvania State University.
Reproduction Note:: Library holds archival microfiche negative and service copy, (Micrographics International, 1994).

View MARC record | catkey: 1785784