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Non-destructive evaluation of microchip cracks and delaminations using C-scan imaging
Author
Moss, David J.
Published
[Place of publication not identified] : [publisher not identified], 1996.
Physical Description
49 leaves : color illustrations
Additional Creators
Pennsylvania State University. University Scholars Program
Full Text available online
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Dissertation Note
B.S. Pennsylvania State University.
Reproduction Note
Library holds archival microfiche negative and service copy, (PSU Management Services, 1996).
View MARC record
| catkey: 1852569