Methods of measurement of semiconductors' surface properties - Application to the study of M.O.S. devices and reliability

Author:: Grosvalet, J
Published:: [Place of publication not identified] : [publisher not identified], 1967.
Physical Description:: pages 401-A TO 401-I.
Additional Creators:: American Institute of Aeronautics and Astronautics. Technical Information Service

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Language Note:

In English.

Subject(s):

Aeronautics

Collection:

IAA papers.

Note:

Abstracted In International Aerospace Abstracts.
Reproduced from: Symposium On Test Methods and Measurements of Semiconductor Devices, Budapest, Hungary; 25-28 Apr. 1967
A67-29810.

Reproduction Note:

Microform. New York : American Institute of Aeronautics and Astronautics, Technical Information Service, [19--?]

View MARC record | catkey: 19121146