Machine vision applications in industrial inspection : 3-4 February 1993, San Jose, California / Frederick Y. Wu, Benjamin M. Dawson, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering

Published: Bellingham, Wash., USA : SPIE, [1993]
Copyright Date: ©1993
Physical Description: x, 272 pages : illustrations ; 28 cm.
Additional Creators: Wu, Frederick Y., Dawson, Benjamin M., IS & T--the Society for Imaging Science and Technology, and Society of Photo-optical Instrumentation Engineers

Browse Nearby on Shelf

Finding items...

Series

Subject(s)

ISBN

081941140X (pbk.)

Bibliography Note

Includes bibliographical references and index.

View MARC record | catkey: 1934945