Email RIS file
Bookmark
Report an Issue

Quantum Metrology, Imaging, and Communication [electronic resource] / by David S. Simon, Gregg Jaeger, Alexander V. Sergienko

Author
Simon, David S.
Published
Cham : Springer International Publishing : Imprint: Springer, 2017.
Physical Description
XII, 273 pages 105 illustrations, 68 illustrations in color : online resource
Additional Creators
Jaeger, Gregg, Sergienko, Alexander V., and SpringerLink (Online service)
Access Online

Availability

I Want It
I Want It

Finding items...

Series
Contents
Quantum Optics and Entanglement -- Two-Photon Interference- Aberration and Dispersion Cancelation -- Quantum Metrology -- Polarization Mode Dispersion -- Ghost Imaging and Related Topics -- Quantum Microscopy -- Correlated and Entangled Orbital Angular Momentum -- Quantum Communication and Cryptography -- Appendices A: Review of Optics -- B: Optical Fields in Quantum Mechanics -- C: Optical Effects of Aberration and Turbulence -- D: Phase Matching in Spontaneous Parametric Down Conversion -- E: Vectorial Scattering Analysis of the Twin-Photon Microscope.
Summary
This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. In particular, it presents novel techniques developed over the last two decades and explicates them both theoretically and by reference to experiments which demonstrate their principles in practice. The particular techniques explored include two-photon interferometry, two-photon optical aberration and dispersion cancellation, lithography, microscopy, and cryptography.
Subject(s)
ISBN
9783319465517
Digital File Characteristics
text file PDF
Part Of
Springer eBooks
View MARC record | catkey: 19570018