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ICMTS 1998 [electronic resource] : proceedings of the 1998 IEEE International Conference on Microelectronic Test Structures, March 23-26, 1998, Kanazawa, Japan / sponsored by the IEEE Electron Devices Society
Conference Author:
IEEE International Conference on Microelectronic Test Structures (1998 : Kanazawa-shi, Japan)
Published:
[New York] : Institute of Electrical and Electronics Engineers, c1998
Physical Description:
x, 240 p. : ill. ; 30 cm.
Additional Creators:
IEEE Electron Devices Society
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Subject(s):
Integrated circuits
—
Testing
—
Congresses
Semiconductors
—
Testing
—
Congresses
Electronic apparatus and appliances
—
Testing
—
Congresses
Genre(s):
Electronic books
ISBN:
0780343484 (softbound)
0780343492 (casebound)
0780343506 (microfiche)
Note:
"IEEE catalog number: 98CH36157"--T.p. verso.
Bibliography Note:
Includes bibliographical references and index.
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| catkey: 20033350