ICMTS 1998 [electronic resource] : proceedings of the 1998 IEEE International Conference on Microelectronic Test Structures, March 23-26, 1998, Kanazawa, Japan / sponsored by the IEEE Electron Devices Society
- Conference Author:
- IEEE International Conference on Microelectronic Test Structures (1998 : Kanazawa-shi, Japan)
- [New York] : Institute of Electrical and Electronics Engineers, c1998
- Physical Description:
- x, 240 p. : ill. ; 30 cm.
- Additional Creators:
- IEEE Electron Devices Society
- Restrictions on Access:
- License restrictions may limit access.
- 0780343484 (softbound), 0780343492 (casebound), and 0780343506 (microfiche)
- "IEEE catalog number: 98CH36157"--T.p. verso.
- Bibliography Note:
- Includes bibliographical references and index.
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