International Test Conference 2004 [electronic resource] : proceedings : October 26-October 28, 2004, Charlotte Convention Center, Charlotte, NC, USA / sponsored by IEEE Computer Society Test Technology Technical Council and IEEE Philadelphia Section

Conference Author: International Test Conference (35th : 2004 : Charlotte, N.C.)
Additional Titles: ITC International Test Conference 2004
Published: Washington, D.C. : International Test Conference ; Piscataway, N.J. : IEEE, c2004.
Physical Description: xvi, 1459 p. : ill. ; 28 cm.
Additional Creators: IEEE Computer Society. Test Technology Technical Committee and Institute of Electrical and Electronics Engineers. Philadelphia Section

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ISBN

0780385802 (pbk.)

Note

Cover title.
"Conference 35 Years"--cover.
"IEEE Catalog Number 04CH37586"--T.p. verso.

Bibliography Note

Includes bibliographical references and author index.

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