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2015 20th International Mixed Signal Testing Workshop (IMSTW) [electronic resource]

Corporate Author
IEEE Staff
Published
Piscataway : IEEE June 2015
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Summary
Annotation The role of nano electronic systems is expanding in every facet of modern life One of the major bottlenecks nowadays for such systems is the high cost of post manufacturing testing of their analog and mixed signal functions, in order to guarantee outgoing quality while not sacrificing yield In addition, safety critical and mission critical systems need to be equipped with self test and fault tolerance capabilities so as to guarantee reliable operation even in harsh environments For such systems, diagnosing the sources of failures occurring in the field of operation is of vital importance, in order to apply corrective actions and to prevent failure reoccurrence Diagnosis is also of vital importance to quickly identify failures in the first prototypes and to shed light on the manufacturing failure mechanisms The International Mixed Signals Testing Workshop is one of the main forums that bring together the test community to discuss ideas and views on the above challenges
Genre(s)
ISBN
9781467367332
1467367338 (Spiral)
Audience Notes
Scholarly & Professional IEEE
View MARC record | catkey: 20056567