Recent advances in metrology, characterization, and standards for optical digital data disks : 21-22 July 1999, Denver, Colorado / sponsored by SPIE--the International Society for Optical Engineering, IDEMA, [and] Information Technology Lab./National Institute of Standards and Technology ; [Fernando Luis Podio, chair/editor].
- Bellingham, Wash., USA : SPIE, 
- Copyright Date:
- Physical Description:
- v, 182 pages : illustrations ; 28 cm.
- Additional Creators:
- Podio, Fernando L.
Society of Photo-optical Instrumentation Engineers
International Disk Drive Equipment and Materials Association
Information Technology Laboratory (National Institute of Standards and Technology)
Full Text available online
By special arrangement in response to the COVID-19 pandemic, patrons may access this resource online through the HathiTrust Emergency Temporary Access Service.
View MARC record | catkey: 2047993