Proceedings of the Third International Symposium on Defects in Silicon / editors, T. Abe [and others].

Conference Author:: International Symposium on Defects in Silicon (3rd : 1999 : Seattle, Wash.)
Additional Titles:: Defects in silicon
Defects in silicon III
Defects in silicon 3
Defects in silicon three
Published:: Pennington, NJ : Electrochemical Society, [1999]
Copyright Date:: ©1999
Physical Description:: ix, 530 pages : illustrations ; 24 cm.
Additional Creators:: Abe, T. (Takeo)
Electrochemical Society. Electronics Division
Electrochemical Society. Meeting (195th : 1999 : Seattle, Wash.)

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Series:

Proceedings ; v. 99-1

Subject(s):

Silicon—Defects—Congresses
Semiconductors—Defects—Congresses

ISBN:

1566772230

Note:

"Electronics Divisions."
Papers presented during the 195th Meeting of the Electrochemical Society, May 2-7, 1999, in Seattle, Wash.

Bibliography Note:

Includes bibliographical references and indexes.

View MARC record | catkey: 2113902