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Actions for Rough surface scattering and contamination : 21-23 July 1999, Denver, Colorado
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Rough surface scattering and contamination : 21-23 July 1999, Denver, Colorado / Philip T. Chen, Zu-Han Gu, Alexei A. Maradudin, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering
Published
Bellingham, Wash., USA : SPIE, [1999]
Copyright Date
©1999
Physical Description
vii, 404 pages : illustrations (some color) ; 28 cm.
Additional Creators
Chen, Philip T.
,
Gu, Zu-Han
,
Maradudin, Alexei A., 1931-
, and
Society of Photo-optical Instrumentation Engineers
Full Text available online
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Series
Proceedings of SPIE--the International Society for Optical Engineering ; v. 3784
Subject(s)
Surface roughness
—
Measurement
—
Congresses
Light
—
Scattering
—
Congresses
Surface contamination
—
Congresses
Space vehicles
—
Contamination
—
Congresses
ISBN
0819432709
Bibliography Note
Includes bibliographical references and index.
View MARC record
| catkey: 2131148