Electron Microscopy and Metallurgical Studies [electronic resource].
- Published
- [Arlington Va.] : [publisher not identified], 1966.
- Physical Description
- 71 pages : figures, tables
Access Online
- Series
- Contents
- FUNDAMENTALS OF TRANSMISSION ELECTRON MICROSCOPY by V. N. Rozhanskiy -- USE OF DIFFRACTION CONTRAST TO STUDY CRYSTAL DEFECTS by V. I Izotov, L. M. Utevskiy -- INVESTIGATING THE MAGNETIC STRUCTURE OF THIN FILMS WITH THE UEMV-100 ELECTRON MICROSCOPE by N. I. Sivkov -- DETERMINING PARTICLE MAGNITUDE IN SYNTHETIC LATEX BY ELECTRON MICROSCOPY by S. E. Selivanovskiy, Yu. M. Yakovlev, A. V. Lebedev, N. A. Fermor -- PREPARING OPJECTS FOR ELECTRON MICROSCOPES BY ETCHING WITH ACTIVE OXYGEN by M. R. Kiselev, E. I. Yevko, V. M. Luk'yanovich -- OBTAINING OXIDE REPLICAS FOR STUDYING THE STRUCTURE OF Zr-Nb ALLOYS by S. V. Sudareva, N. N. Buynov, V. A. Vozilkin -- IMAGE AMPLIFIER FOR THE UEMV-100 ELECTRON MICROSCOPE by I. F. Anaskin, I. G. Stoyanova, B. L. Kozlov, V. F. Semenov -- FIFTH ALL-UNION CONFERENCE ON ELECTRON MICROSCOPY¹.
- Report Numbers
- Y 3.J 66:
- Subject(s)
- Note
- Document Date: 6/23/1966.
- Reproduction Note
- Electronic reproduction. Chester, Vt. : NewsBank, inc., 2013. Available via the World Wide Web. Access restricted to Readex Joint Publications Research Service (JPRS) Reports subscribers.
- Terms of Use and Reproduction
- Copyright 2013 by NewsBank, inc. All rights reserved.
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