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Error analysis and calibration uncertainty of capacitance standards at NIST [microform] / Y. May Chang

Author:: Chang, Y. May
Published:: Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [2000]
[Washington, DC] : [For sale by the Supt. of Docs., U.S. G.P.O.]
Physical Description:: 1 volume (various pagings) : illustrations ; 28 cm.
Additional Creators:: National Institute of Standards and Technology (U.S.)

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Series:

Report Numbers:

C 13.10:250-52

Subject(s):

Note:

Shipping list no.: 2000-0465-M.
"January 2000."
Paper version no longer available for sale by the Supt. of Docs.

Bibliography Note:

Includes bibliographical references (pages 38-39).

Reproduction Note:

Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., 2000. 2 microfiches : negative ; 11 x 15 cm.

View MARC record | catkey: 2149026