1966 annual Symposium on Reliability : proceedings : San Francisco, California, January 25, 26, 27, 1966 / sponsored by IEEE [and others].

Conference Author: Symposium on Reliability, (1966 : San Francisco, Calif)
Published: New York : Institute of Electrical and Electronics Engineers, 1966.
Physical Description: iv, 764 pages : illustrations, graphs ; 26 cm
Additional Creators: Institute of Electrical and Electronics Engineers, Institute of Environmental Sciences, Society for Nondestructive Testing, and American Society for Quality Control

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