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State-of-the-art infrared detector technology / Michael A. Kinch

Author
Kinch, Michael A.
Published
Bellingham, Washington (1000 20th St. Bellingham WA 98225-6705 USA) : SPIE, 2014.
Physical Description
1 online resource (286 pages) : illustrations
Additional Creators
Society of Photo-Optical Instrumentation Engineers
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Restrictions on Access
Restricted to subscribers or individual electronic text purchasers.
Contents
Cooled infrared detector architectures -- Infrared focal plane array considerations -- Dark current considerations -- Noise considerations -- Infrared materials for focal plane arrays -- HgCdTe FPA technologies -- III-V detectors -- A technology comparison -- The future of infrared FPA technology -- Epilogue -- Appendix A: Reverse-biased heterojunctions -- Appendix B: Shockley-Read Bandgap states.
Summary
Scientists, engineers, managers, and policy makers who are currently involved in the funding of infrared R&D and subsequent system design and manufacture are confronted with a choice between two competing materials technologies, HgCdTe and III-V alloys. This book examines both the current and future performance of infrared focal plane arrays that use the various device architectures associated with these two materials technologies. All spectral bands from long wavelength (LWIR) through mid-wavelength (MWIR) to short wavelength (SWIR) are considered, ultimately with a view to achieving background and diffraction-limited system performance at room temperature for all wavelengths.
Subject(s)
Genre(s)
ISBN
9781628412901 electronic
9781628412895 print
Note
"SPIE Digital Library."--Website.
Bibliography Note
Includes bibliographical references.
Other Forms
Also available in print version.
Technical Details
Mode of access: World Wide Web.
System requirements: Adobe Acrobat Reader.
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