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Characterization of organic thin films [electronic resource] / editors, Yale Strausser and Gary E. McGuire

Published
[New York, N.Y.] (222 East 46th Street, New York, NY 10017) : Momentum Press, 2010.
Edition
1st ed.
Physical Description
1 electronic text (xvii, 276 pages : illustrations) : digital file
Additional Creators
Ulman, Abraham, 1946-, Strausser, Yale, and McGuire, G. E.
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Contents
Preface to the reissue of the Materials characterization series -- Preface to series -- Preface to the reissue of Characterization of organic thin films -- Preface -- Contributors --, Part I. Preparation and materials --, 1. Langmuir-Blodgett films -- 1.1. Introduction -- 1.2. L-B films of long-chain compounds -- Fatty acids -- Amines -- Other long-chain compounds -- 1.3. Cyclic compounds and chromophores -- 1.4. Polymers and proteins -- 1.5. Polymerization in situ -- 1.6. Alternation films (superlattices) -- 1.7. Potential applications --, 2. Self-assembled monolayers -- 2.1. Introduction -- 2.2. Monolayers of fatty acids -- 2.3. Monolayers of organosilicon derivatives -- 2.4. Monolayers of alkanethiolates on metal and semiconductor surfaces -- 2.5. Self-assembled monolayers containing aromatic groups -- 2.6. Conclusions --, Part II. Analysis of film and surface properties --, 3. Spectroscopic ellipsometry -- 3.1. Introduction and overview -- 3.2. Theory of ellipsometry -- 3.3. Instrumentation -- 3.4. Determination of optical properties -- Analysis of single ellipsometric spectra: direct inversion methods -- Analysis of single ellipsometric spectra: least-squares regression analysis method -- Analysis of multiple ellipsometric spectra -- 3.5. Determination of thin film structure -- Thickness determination for monolayers -- Microstructural evolution in thick film growth -- 3.6. Future prospects --, 4. Infrared spectroscopy in the characterization of organic thin films -- 4.1. Introduction -- Specific needs for characterizing organic thin films -- General principles and capabilities of infrared spectroscopy for surface and thin film analysis -- 4.2. Quantitative aspects -- Spectroscopic intensities -- Electromagnetic fields in thin film structures -- 4.3. The infrared spectroscopic experiment -- General instrumentation -- Experimental modes -- Additional aspects -- 4.4. Examples of applications -- Self-assembled monolayers on gold by external reflection -- Octadecylsiloxane monolayers on SiO2 by transmission -- Langmuir-Blodgett films on nonmetallic substrates by external reflection --, 5. Raman spectroscopic characterization of organic thin films -- 5.1. Introduction -- 5.2. Fundamentals of Raman spectroscopy -- 5.3. Instrumental considerations -- 5.4. Raman spectroscopic approaches for the characterization of organic thin films -- Integrated optical waveguide Raman spectroscopy (IOWRS) -- Total internal reflection Raman spectroscopy -- Surface enhanced Raman scattering -- Normal Raman spectroscopy -- Resonance Raman spectroscopy -- Plasmon surface polariton enhanced Raman spectroscopy -- Fourier transform Raman spectroscopy -- Waveguide surface coherent anti-stokes Raman spectroscopy (WSCARS) -- 5.5. Selected examples of thin film analyses -- Raman spectral characterization of Langmuir-Blodgett layers of arachidate and stearate salts -- Raman spectral characterization of self-assembled monolayers of alkanethiols on metals -- Surface enhanced resonance Raman spectral characterization of Langmuir-Blodgett layers of phthalocyanines -- 5.6. Prospects for Raman spectroscopic characterization of thin films --, 6. Surface potential -- 6.1. Introduction -- 6.2. Origins of the contact potential difference and surface potential -- The work function -- Contact potential difference and surface potential -- Surface potential changes induced by adsorbates -- 6.3. Measurement of surface potential -- Capacitance techniques -- Ionizing-probe technique -- 6.4. Surface potentials of organic thin films -- Air-water interface: surface potential of Langmuir monolayers -- Air-solid interface: surface potential of L-B and related films -- 6.5. Conclusions --, 7. X-ray diffraction -- 7.1. Introduction -- 7.2. Basic principles -- 7.3. Structure normal to film plane -- 7.4. Structure within the film plane -- 7.5. Summary --, 8. High resolution EELS studies of organic thin films and surfaces -- 8.1. Introduction -- 8.2. The scattering mechanism -- Dipole scattering -- Impact scattering -- Resonance scattering -- 8.3. The spectrometer -- 8.4. EELS versus other techniques: advantages and disadvantages -- 8.5. Examples -- Resolution enhancement -- Linearity -- Depth sensitivity -- Molecular orientation -- Local versus long-range interactions -- Surface segregation -- 8.6. Conclusions --, 9. Wetting -- 9.1. Introduction -- 9.2. Contact angles -- 9.3. Techniques for contact angle measurements -- Axisymmetric drop shape analysis-profile (ADSA-P) -- Axisymmetric drop shape analysis-contact diameter (ADSA-CD) -- Capillary rise technique -- 9.4. Phase rule for moderately curved surface systems -- 9.5. Equation of state for interfacial tensions of solid-liquid systems -- 9.6. Drop size dependence of contact angle and line tension -- 9.7. Contact angles in the presence of a thin liquid film -- 9.8. Effects of elastic liquid-vapor interfaces on wetting --, 10. Secondary ion mass spectrometry as applied to thin organic and polymeric films -- 10.1. Introduction and background -- Overview of the SIMS method and experiment -- Ion formation mechanisms -- Comparisons to other surface analysis techniques -- The motivation for thin organic films as model systems -- 10.2. Qualitative information: mechanisms of secondary molecular ion formation -- Structure-ion formation relationships -- Applications to self-assembled film chemistry -- 10.3. The study of sampling depth in the SIMS experiment -- 10.4. Quantitation in SIMS -- Development of quantitation methods -- Application of quantitative schemes to thin film chemistry -- 10.5. Imaging applications -- 10.6. Summary and prospects --, 11. X-ray photoelectron spectroscopy of organic thin films -- 11.1. Introduction -- 11.2. Experimental considerations -- 11.3. Binding energy shifts -- 11.4. XPS of molten films -- 11.5. Angular dependent XPS -- 11.6. ETOA XPS of self-assembled monolayers -- 11.7. Conclusions --, 12. Molecular orientation in thin films as probed by optical second harmonic generation -- 12.1. Introduction -- 12.2. Experimental considerations -- 12.3. Molecular nonlinear polarizability calculation -- 12.4. Measurements of the surface monlinear susceptibility -- 12.5. Molecular orientation calculation -- 12.6. Absolute molecular orientation measurements -- 12.7. Summary and conclusions --, and Appendix. Technique summaries -- 1: Auger Electron Spectroscopy (AES) -- 2: Dynamic Secondary Ion Mass Spectrometry (Dynamic SIMS) -- 3: Fourier Transform Infrared Spectroscopy (FTIR) -- 4: High-Resolution Electron Energy Loss Spectroscopy (HREELS) -- 5: Low-Energy Electron Diffraction (LEED) -- 6: Raman Spectroscopy -- 7: Scanning Electron Microscopy (SEM) -- 8: Scanning Tunneling Microscopy (STM) and Scanning Force Microscopy (SFM) -- 9: Static Secondary Ion Mass Spectrometry (Static SIMS) -- 10: Transmission Electron Microscopy (TEM) -- 11: Variable-Angle Spectroscopic Ellipsometry (VASE) -- 12: X-Ray Diffraction (XRD) -- 13: X-Ray Fluorescence (XRF) -- 14: X-Ray Photoelectron Spectroscopy (XPS) -- Index.
Summary
Materials science is at the center of academic and industrial research today. In the past ten years, it has become apparent that the way materials scientists operate should change, and that a design approach must be used in the preparation of new materials. This is best represented by the research done in the area of organic thin films, where a useful property is identified a priori, an appropriate molecule designed and synthesized, and the corresponding film prepared.
Subject(s)
Other Subject(s)
ISBN
9781606500460 (electronic bk.)
1606500465 (electronic bk.)
9781606500446 (print)
1606500449 (print)
Note
"First published by Butterworth-Heinemann in 1995."
Author on cover: Abraham Ulman.
Bibliography Note
Includes bibliographical references and index.
Other Forms
Also available in print.
Technical Details
Mode of access: World Wide Web.
System requirements: Adobe Acrobat reader.
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