Actions for Distributed testing of a device-level interface specification for a metrology system [microform]

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Distributed testing of a device-level interface specification for a metrology system [microform] / John Horst [and others].

Published
Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [2002]
Physical Description
19 pages : illustrations ; 28 cm.
Additional Creators
Horst, John Albert and National Institute of Standards and Technology (U.S.)

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Series
Report Numbers
C 13.58:6851
Subject(s)
Note
"January 2002."
Shipping list no.: 2002-0384-M.
Bibliography Note
Includes bibliographical references (page 19).
Reproduction Note
Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., 2002. 1 microfiche : negative ; 11 x 15 cm.
Action Note
committed to retain. Federal Depository Library Program (FDLP). For information on our retention commitment, please contact Microforms and Government Information.
View MARC record | catkey: 2312178