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Method for using polarization gating to measure a scattering sample [electronic resource].

Published:
Washington, D.C. : United States. Dept. of Energy, 2015.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy
Additional Creators:
Oak Ridge National Laboratory, United States. Department of Energy, and United States. Department of Energy. Office of Scientific and Technical Information
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Summary:
Described herein are systems, devices, and methods facilitating optical characterization of scattering samples. A polarized optical beam can be directed to pass through a sample to be tested. The optical beam exiting the sample can then be analyzed to determine its degree of polarization, from which other properties of the sample can be determined. In some cases, an apparatus can include a source of an optical beam, an input polarizer, a sample, an output polarizer, and a photodetector. In some cases, a signal from a photodetector can be processed through attenuation, variable offset, and variable gain.
Report Numbers:
E 1.99:9,097,647
9,097,647
Subject(s):
Note:
Published through SciTech Connect.
08/04/2015.
"9,097,647"
"13/962,826"
Baba, Justin.
Funding Information:
AC05-00OR22725
View MARC record | catkey: 23503491