High numerical aperture multilayer Laue lenses [electronic resource].
- Washington, D.C. : United States. Dept. of Energy, 2015.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy
- Physical Description:
- Article numbers 9,892 : digital, PDF file
- Additional Creators:
- SLAC National Accelerator Laboratory
United States. Department of Energy
United States. Department of Energy. Office of Scientific and Technical Information
- The ever-increasing brightness of synchrotron radiation sources demands improved X-ray optics to utilise their capability for imaging and probing biological cells, nanodevices, and functional matter on the nanometer scale with chemical sensitivity. Here we demonstrate focusing a hard X-ray beam to an 8 nm focus using a volume zone plate (also referred to as a wedged multilayer Laue lens). This lens was constructed using a new deposition technique that enabled the independent control of the angle and thickness of diffracting layers to microradian and nanometer precision, respectively. This ensured that the Bragg condition is satisfied at each point along the lens, leading to a high numerical aperture that is limited only by its extent. We developed a phase-shifting interferometric method based on ptychography to characterise the lens focus. The precision of the fabrication and characterisation demonstrated here provides the path to efficient X-ray optics for imaging at 1 nm resolution.
- Published through SciTech Connect.
Scientific Reports 5 ISSN 2045-2322 AM
Morgan, Andrew; Prasciolu, Mauro; Andrejczuk, Andrzej; Krzywinski, Jacek; Meents, Alke; Pennicard, David; Graafsma, Heinz; Barty, Anton; Bean, Richard; Barthelmess, Miriam; Oberthuer, Dominik; Yefanov, Oleksandr; Aquila, Andrew; Chapman, Henry; Bajt, Saša.
- Funding Information:
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