X-ray metrology and performance of a 45-cm long x-ray deformable mirror [electronic resource].

Published: Washington, D.C. : United States. Dept. of Energy, 2016.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy
Physical Description: Article numbers 052,003 : digital, PDF file
Additional Creators: Lawrence Berkeley National Laboratory, United States. Department of Energy, and United States. Department of Energy. Office of Scientific and Technical Information

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Summary

We describe experiments with a 45-cm long x-ray deformable mirror (XDM) that have been conducted in End Station 2, Beamline 5.3.1 at the Advanced Light Source. A detailed description of the hardware implementation is provided. We explain our one-dimensional Fresnel propagation code that correctly handles grazing incidence and includes a model of the XDM. This code is used to simulate and verify experimental results. Initial long trace profiler metrology of the XDM at 7.5 keV is presented. The ability to measure a large (150-nm amplitude) height change on the XDM is demonstrated. The results agree well with the simulated experiment at an error level of 1 μrad RMS. Lastly, direct imaging of the x-ray beam also shows the expected change in intensity profile at the detector.

Report Numbers

E 1.99:llnl-jrnl--678726
llnl-jrnl--678726

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Note

Published through SciTech Connect.
05/20/2016.
"llnl-jrnl--678726"
Review of Scientific Instruments 87 5 ISSN 0034-6748; RSINAK AM
Lisa A. Poyneer; Nicolai F. Brejnholt; Randall Hill; Jessie Jackson; Lisle Hagler; Richard Celestre; Jun Feng.

Funding Information

AC52-07NA27344

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