Ion microprobe mass spectrometry using sputtering atomization and resonance ionization [electronic resource] : annual progress report
- Oak Ridge, Tenn. : Oak Ridge National Laboratory, 1986.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy
- Physical Description:
- Pages: 30 : digital, PDF file
- Additional Creators:
- Oak Ridge National Laboratory and United States. Department of Energy. Office of Scientific and Technical Information
- Restrictions on Access:
- Free-to-read Unrestricted online access
- Resonance Ionization Mass Spectrometry (RIMS) utilizing ion beam sputtering atomization has been applied to the measurement of U and Sm. The goal is to produce an ultrasensitive analytical technique for measuring elements of environmental concern in small particles or inclusions. An ion microprobe mass analyzer (IMMA) has been modified to allow production of a sputtered atom plum through which high powered tunable laser radiation is directed. Ions of a given element are produced by a multistep resonance ionization process followed by extraction into a double-focusing mass spectrometer for detection. Data are presented showing mass and optical spectra obtained as well as the sensitivity of the techniques. 22 refs., 9 figs., 1 tab.
- Report Numbers:
- E 1.99:ornl/tm-9949
- Published through SciTech Connect.
Goeringer, D.E.; Christie, W.H.; McKown, H.S.; Donohue, D.L.
- Funding Information:
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