Actions for Development of a fast framing detector for electron microscopy [electronic resource].

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Development of a fast framing detector for electron microscopy [electronic resource].

Published
Washington, D.C. : United States. Dept. of Energy. Office of Basic Energy Sciences, 2016.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy
Physical Description
pages 1-2 : digital, PDF file
Additional Creators
Lawrence Berkeley National Laboratory, United States. Department of Energy. Office of Basic Energy Sciences, and United States. Department of Energy. Office of Scientific and Technical Information
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Summary
A high frame rate detector system is described that enables fast real-time data analysis of scanning diffraction experiments in scanning transmission electron microscopy (STEM). This is an end-to-end development that encompasses the data producing detector, data transportation, and real-time processing of data. The detector will consist of a central pixel sensor that is surrounded by annular silicon diodes. Both components of the detector system will synchronously capture data at almost 100 kHz frame rate, which produces an approximately 400 Gb/s data stream. Low-level preprocessing will be implemented in firmware before the data is streamed from the National Center for Electron Microscopy (NCEM) to the National Energy Research Scientific Computing Center (NERSC). Live data processing, before it lands on disk, will happen on the Cori supercomputer and aims to present scientists with prompt experimental feedback. This online analysis will provide rough information of the sample that can be utilized for sample alignment, sample monitoring and verification that the experiment is set up correctly. Only a compressed version of the relevant data is then selected for more in-depth processing.
Report Numbers
E 1.99:1436646
Subject(s)
Note
Published through SciTech Connect.
10/01/2016.
"ark:/13030/qt7dx1946x"
2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016, Strasbourg (France), 29 Oct - 6 Nov 2016.
Johnson, Ian; Bustillo, Karen; Ciston, Jim; Dart, Eli; Draney, Brent; Ercius, Peter; Fong, Erin; Grace, Carl; Joseph, John; Lee, Jason; Minor, Andrew; Ophus, Colin; Skinner, David; Stezelberger, Thorsten; Tindall, Craig; Denes, Peter.
Funding Information
AC02-05CH11231
View MARC record | catkey: 24048621