Yielding of tantalum at strain rates up to 10<sup>9</sup> s<sup>–1</sup> [electronic resource].
- Washington, D.C. : United States. Dept. of Energy, 2016.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy
- Physical Description:
- Article numbers 094,102 : digital, PDF file
- Additional Creators:
- Lawrence Berkeley National Laboratory, United States. Department of Energy, and United States. Department of Energy. Office of Scientific and Technical Information
- Restrictions on Access:
- Free-to-read Unrestricted online access
- Here, we have used a 45 μJ laser pulse to accelerate the free surface of fine-grained tantalum films up to peak velocities of ~1.2 km s–1. The films had thicknesses of ~1–2 μm and in-plane grain widths of ~75–150 nm. Using ultrafast interferometry, we have measured the time history of the velocity of the surface at different spatial positions across the accelerated region. The initial part of the histories (assumed to correspond to the “elastic precursor” observed previously) exhibited measured strain rates of ~0.6 to ~3.2 × 109 s–1 and stresses of ~4 to ~22 GPa.
- Report Numbers:
- E 1.99:llnl-jrnl--690544
- Published through SciTech Connect.
Applied Physics Letters 109 9 ISSN 0003-6951 AM
Jonathan C. Crowhurst; Michael R. Armstrong; Sean D. Gates; Joseph M. Zaug; Harry B. Radousky; Nick E. Teslich.
- Funding Information:
View MARC record | catkey: 24059947