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Thermographic Microstructure Monitoring in Electron Beam Additive Manufacturing [electronic resource].

Published
Washington, D.C. : United States. Dept. of Energy. Office of Energy Efficiency and Renewable Energy, 2017.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy
Physical Description
1 : digital, PDF file
Additional Creators
Oak Ridge National Laboratory, United States. Department of Energy. Office of Energy Efficiency and Renewable Energy, and United States. Department of Energy. Office of Scientific and Technical Information
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Summary
To reduce the uncertainty of build performance in metal additive manufacturing, robust process monitoring systems that can detect imperfections and improve repeatability are desired. One of the most promising methods for in-situ monitoring is thermographic imaging. However, there is a challenge in using this technology due to the difference in surface emittance between the metal powder and solidified part being observed that affects the accuracy of the temperature data collected. This developed a method for properly calibrating temperature profiles from thermographic data and then determining important characteristics of the build through additional processing. The thermographic data was analyzed to determine the transition of material from metal powder to a solid as-printed part. A corrected temperature profile was then assembled for each point using calibrations for these surface conditions. Using this data, we calculated the thermal gradient and solid-liquid interface velocity and correlated it to microstructural variation within the part experimentally. This work shows that by using a method of process monitoring, repeatability of a build could be monitored specifically in relation to microstructure control.
Report Numbers
E 1.99:1349606
Subject(s)
Other Subject(s)
Note
Published through SciTech Connect.
03/03/2017.
"ED2701000"
"CEED492"
Scientific Reports 7 ISSN 2045-2322 AM
Jake B. Raplee; Alex J. Plotkowski; Michael M. Kirka; Ralph Barton Dinwiddie; Alfred O Okello; Ryan R. Dehoff; Sudarsanam Suresh Babu.
Funding Information
AC05-00OR22725
View MARC record | catkey: 24060454