A short story of imaging and spectroscopy of two-dimensional materials by scanning transmission electron microscopy [electronic resource].
- Washington, D.C. : United States. Dept. of Energy. Office of Science, 2017. and Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy
- Physical Description:
- 7 pages : digital, PDF file
- Additional Creators:
- Oak Ridge National Laboratory, United States. Department of Energy. Office of Science, and United States. Department of Energy. Office of Scientific and Technical Information
- Here we present a short historical account of when single adatom impurities where first identified in two-dimensional materials by scanning transmission electron microscopy (STEM). We also present a study of the graphene low-loss (below 50 eV) response as a function of number of layers using electron energy-loss spectroscopy (EELS). The study shows that as few as three layers of graphene behave as bulk graphite for losses above 10 eV We also show examples of how point and extended defects can easily be resolved and structural dynamics can be readily capture by using aberration-corrected STEM imaging. Lastly, we show that the new generation of monochromators has opened up possibilities to explore new physics with an electron microscope. All these capabilities were enabled by the development of spherical aberration correctors and monochromators, where Ondrej Krivanek has played a key role.
- Published through SciTech Connect., 03/01/2017., "KC0403040", "ERKCZ01", Ultramicroscopy 180 ISSN 0304-3991 AM, and Juan Carlos Idrobo Tapia; Wu Zhou.
- Funding Information:
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