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Correlation between piezoresponse nonlinearity and hysteresis in ferroelectric crystals at nanoscale [electronic resource].

Published
Washington, D.C. : United States. Dept. of Energy. Office of Science, 2016.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy
Physical Description
Article numbers 172,905 : digital, PDF file
Additional Creators
Oak Ridge National Laboratory, United States. Department of Energy. Office of Science, and United States. Department of Energy. Office of Scientific and Technical Information
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Summary
Here, the nonlinear response of a ferroic to external fields has been studied for decades, garnering interest for both understanding fundamental physics, as well as technological applications such as memory devices. Yet, the behavior of ferroelectrics at mesoscopic regimes remains poorly understood, and the scale limits of theories developed for macroscopic regimes are not well tested experimentally. Here, we test the link between piezo-nonlinearity and local piezoelectric strain hysteresis, via AC-field dependent measurements in conjunction with first order reversal curve (FORC) measurements on (K,Na)NbO3 crystals with band-excitation piezoelectric force microscopy. The correlation coefficient between nonlinearity amplitude and the FORC of the polarization switching shows a clear decrease in correlation with increasing AC bias, suggesting the impact of domain wall clamping on the DC measurement case. Further, correlation of polynomial fitting terms from the nonlinear measurements with the hysteresis loop area reveals that the largest correlations are reserved for the quadratic terms, which is expected for irreversible domain wall motion contributions that impact both piezoelectric behavior as well as minor loop formation. These confirm the link between local piezoelectric nonlinearity, domain wall motion and minor loop formation, and suggest that existing theories (such as Preisach) are applicable at these length scales, with associated implications for future nanoscale devices.
Report Numbers
E 1.99:1256822
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Note
Published through SciTech Connect.
04/27/2016.
"KC0403040"
"ERKCZ01"
Applied Physics Letters 108 17 ISSN 0003-6951; APPLAB AM
Sergei V. Kalinin; Stephen Jesse; Yaodong Yang; Linglong Li; Zhengchun Liu; Rama K. Vasudevan.
Funding Information
AC05-00OR22725
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