Electronic structure evolution of fullerene on CH<sub>3</sub>NH<sub>3</sub>PbI<sub>3</sub> [electronic resource].
- Published:
- Washington, D.C. : United States. Dept. of Energy, 2015.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy - Physical Description:
- Article numbers 111,603 : digital, PDF file
- Additional Creators:
- University of Nebraska--Lincoln, United States. Department of Energy, and United States. Department of Energy. Office of Scientific and Technical Information
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- Restrictions on Access:
- Free-to-read Unrestricted online access
- Summary:
- The thickness dependence of fullerene on CH3NH3PbI3 perovskitefilm surface has been investigated by using ultraviolet photoemission spectroscopy (UPS), X-ray photoemission spectroscopy(XPS), and inverse photoemission spectroscopy (IPES). The lowest unoccupied molecular orbital and highest occupied molecular orbital (HOMO) can be observed directly with IPES and UPS. It is observed that the HOMO level in fullerene shifts to lower binding energy. The XPS results show a strong initial shift of core levels to lower binding energy in the perovskite, which indicates that electrons transfer from the perovskitefilm to fullerene molecules. Further deposition of fullerene forms C60 solid, accompanied by the reduction of the electron transfer. As a result, the strongest electron transfer happened at 1/4 monolayer of fullerene.
- Report Numbers:
- E 1.99:1238030
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- Other Subject(s):
- Note:
- Published through SciTech Connect.
03/19/2015.
Applied Physics Letters 106 11 ISSN 0003-6951; APPLAB AM
Chenggong Wang; Congcong Wang; Xiaoliang Liu; John Kauppi; Yuchuan Shao; Zhengguo Xiao; Cheng Bi; Jinsong Huang; Yongli Gao. - Funding Information:
- EE0006709
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