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Noise as a tool for studying materials / Michael b. Weissman, Nathan E. Israeloff, A. Shulim Kogan, chairs ; editors
Published:
Bellingham, Wash., USA : SPIE, [2003]
Copyright Date:
©2003
Physical Description:
x, 346 pages : ills. ; 28 cm.
Additional Creators:
Weissman, Michael B.
,
Israeloff, Nathan E. (Nathan Eli), 1961-
,
Kogan, Sh.
, and
Society of Photo-optical Instrumentation Engineers
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Series:
Proceedings of SPIE--the International Society for Optical Engineering ; v. 5112
Subject(s):
Amorphous substances
—
Analysis
—
Congresses
Amorphous substances
—
Noise
—
Measurement
—
Congresses
Amorphous semiconductors
—
Analysis
—
Congresses
Amorphous semiconductors
—
Noise
—
Measurement
—
Congresses
Fluctuations (Physics)
—
Congresses
ISBN:
0819449725
Note:
"2-4 June 2003, Santa Fe, New Mexico, USA."
"Sponsored by SPIE-- The International Society for Optical Engineering ... "
Bibliography Note:
Includes bibliographical references and index.
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| catkey: 2464660