Email RIS file
Bookmark
Report an Issue

Method for measuring axis orthogonality in MEMS accelerometers / Craig D. McGray; Yaqub Afridi; Jon Geist

Author
McGray, Craig D.
Published
Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2013.
Physical Description
1 online resource (11 pages) : illustrations (some color).
Additional Creators
Afridi, Yaqub, Geist, Jon, McGray, Craig D., and National Institute of Standards and Technology (U.S.). Semiconductor and Dimensional Division, Physical Measurement Laboratory
Access Online

Availability

I Want It
I Want It

Finding items...

Series
Restrictions on Access
Free-to-read Unrestricted online access
Report Numbers
C 13.58:7925
Subject(s)
Note
"July 2013."
Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
Title from PDF title page (viewed July 16, 2013).
Bibliography Note
Includes bibliographical references.
Action Note
committed to retain. Federal Depository Library Program (FDLP). For information on our retention commitment, please contact Microforms and Government Information.
View MARC record | catkey: 26484395