Novel characterization methods for microcrystalline silicon [electronic resource] : final report, May 1999-December 2002 / S.L. Dexheimer and K.G. Lynn
Mode of access: Internet from the NREL web site. Address as of 5/11/04: http://www.nrel.gov/docs/fy04osti/34949.pdf; current access available via PURL.
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