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Principles and Applications of Photoelectron and Ion Spectroscopy for the Analysis of Polymer Surfaces / JA. Gardella

Conference Author
Analysis of Paints and Related Materials: Current Techniques for Solving Coatings Problems (1990 : Pittsburgh, Pennsylvania)
Physical Description
1 online resource (14 pages) : illustrations, figures, tables
Additional Creators
Gardella, JA., American Society for Testing and Materials, and ASTM International
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Summary
Advances in the development of techniques for the energy and mass analysis of ejected particles, form the basis of their use as surface analytical spectroscopies. Methods such as X-ray photoelectron spectroscopy (XPS or ESCA), low-energy ion-scattering spectroscopy (ISS), and secondary ion mass spectrometry (SIMS) are becoming more widely applicable to problems in the chemical analysis of coatings surfaces and interfaces. In this paper a brief review of instrumentation and theory allows projection of new capabilities for the method. Recent progress in the analysis of homopolymer and multicomponent polymer interfaces is described.
Dates of Publication and/or Sequential Designation
Volume 1992, Issue 1119 (January 1992)
Subject(s)
Other Subject(s)
ISBN
9780803151833 (e-ISBN)
9780803114654
0803114656
Digital File Characteristics
text file PDF
Bibliography Note
Includes bibliographical references 38.
Other Forms
Also available online via the World Wide Web. Tables of contents and abstracts freely available; full-text articles available by subscription.
Full text article also available for purchase.
Also available in PDF edition.
Reproduction Note
Electronic reproduction. W. Conshohocken, Pa. : ASTM International, 1992. Mode of access: World Wide Web. System requirements: Web browser. Access may be restricted to users at subscribing institutions.
Technical Details
Mode of access: World Wide Web.
Source of Acquisition
ASTM International PDF Purchase price USD25.
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