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Practical Applications of Quantitative Metallography / H. Abrams

Conference Author
Stereology and Quantitative Metallography (1971 : Atlantic City, N. J.)
Physical Description
1 online resource (45 pages) : illustrations, figures, tables
Additional Creators
Abrams, H., American Society for Testing and Materials, and ASTM International
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Summary
An improved procedure based on the intercept method of measuring the grain size of single-phase microstructures has been developed that provides a quantitative description of the grain size yet is fast. The procedure combines the statistical advantage of using large numbers with the advantage of interpreting the data as a normal distribution, as verified by the chi square test. Application of the procedure to ferritic microstructures representative of best and worst case conditions indicates that accuracies on the order of 3 percent at a 95 percent confidence level can be achieved. In addition, the procedure is sensitive enough to distinguish a randomly mixed duplex grain structure. The measurements associated with a two-phase microstructure can be more precisely quantified through determination of volume fractions using a Pp measurement based on the use of an appropriate grid network, the coefficient of variation statistic, and the Poisson distribution. The analysis is demonstrated for an a priori system for which the percent accuracy and confidence level can be specified for the volume fraction measurement simply from calculation of the average value for Pp.
Dates of Publication and/or Sequential Designation
Volume 1972, Issue 504 (January 1972)
Subject(s)
Other Subject(s)
ISBN
9780803146105 (e-ISBN)
9780803100954
0803100957
Digital File Characteristics
text file PDF
Bibliography Note
Includes bibliographical references 6.
Other Forms
Also available online via the World Wide Web. Tables of contents and abstracts freely available; full-text articles available by subscription.
Full text article also available for purchase.
Also available in PDF edition.
Reproduction Note
Electronic reproduction. W. Conshohocken, Pa. : ASTM International, 1972. Mode of access: World Wide Web. System requirements: Web browser. Access may be restricted to users at subscribing institutions.
Technical Details
Mode of access: World Wide Web.
Source of Acquisition
ASTM International PDF Purchase price USD25.
View MARC record | catkey: 27990098