Chapter 4¿̐ưSelected Area Electron Diffraction Analysis of Extraction Replica and Thin Foil Specimens in the Transmission Electron Microscope

Physical Description:: 1 online resource (32 pages) : illustrations, figures, tables
Additional Creators:: American Society for Testing and Materials and ASTM International

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Summary:

This procedure is intended as a guide for satisfactory selected area electron diffraction (SAED) analysis in the transmission electron microscope (TEM), of extraction replica and thin foil specimens. It is intended to help those who have a minimal understanding of crystallography but desire to use electron diffraction analysis for identification of precipitates or determination of their orientation (or orientation of other substructural features) relative to the matrix or both. A stepwise outline form is presented of the procedures to be followed without much theoretical background; however, a list of references1¿̐ư6]2 is provided to supplement this procedure with as much theory as is desired. Two examples of the application of the procedure are also given.

Dates of Publication and/or Sequential Designation:

Volume 1973, Issue 547 (January 1973)

Subject(s):

ISBN:

9780803146341 (e-ISBN)
9780803103979
0803103972

Digital File Characteristics:

text file PDF

Bibliography Note:

Includes bibliographical references 11.

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Also available online via the World Wide Web. Tables of contents and abstracts freely available; full-text articles available by subscription.
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Electronic reproduction. W. Conshohocken, Pa. : ASTM International, 1973. Mode of access: World Wide Web. System requirements: Web browser. Access may be restricted to users at subscribing institutions.

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Mode of access: World Wide Web.

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ASTM International PDF Purchase price USD25.

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