Effects of Sample Inhomogeneity and Geometry on Photoconductivity Decay / T. Wang, TF. Ciszek
- Conference Author
- Recombination Lifetime Measurements in Silicon (1997 : Santa Clara, CA)
- Physical Description
- 1 online resource (11 pages) : illustrations, figures, tables
- Additional Creators
- Wang, T., Ciszek, TF., American Society for Testing and Materials, and ASTM International
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License restrictions may limit access. - Summary
- Excess minority carrier decay is simulated by a finite element method in cylindrical, rectangular (including epitaxial structures), and wafer samples with consideration of limited absorption of excitation light and spatial variation of lifetime in multicrystalline materials. It is found that, as long as a lifetime is derived from a later part of a phtoconductivity decay where a single-exponential signal is obtained, (1) the ASTM correction factors are valid for large bulk samples without the need to roughen the surfaces; (2) the 1-D asymptotic solution commonly used for lifetime measurements on wafers does not agree with the simulation for intermediate (102~104 cm/sec) surface recombination velocities and thin wafers (<0.1 cm); (3) for multicrystalline samples, the final decay represents overall quality of the material; and (4) when grain sizes are much less than the effective carrier diffusion length, carrier injection is uniform, and no surface nor grain boundary recombination is present, the effective lifetime of a multicrystalline material is the inverse of the volume-weighted inverse sum of local lifetimes.
- Dates of Publication and/or Sequential Designation
- Volume 1998, Issue 1340 (January 1998)
- Subject(s)
- Other Subject(s)
- ISBN
- 9780803153899 (e-ISBN)
9780803124899
0803124899 - Digital File Characteristics
- text file PDF
- Bibliography Note
- Includes bibliographical references 5.
- Other Forms
- Also available online via the World Wide Web. Tables of contents and abstracts freely available; full-text articles available by subscription.
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Also available in PDF edition. - Reproduction Note
- Electronic reproduction. W. Conshohocken, Pa. : ASTM International, 1998. Mode of access: World Wide Web. System requirements: Web browser. Access may be restricted to users at subscribing institutions.
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- ASTM International PDF Purchase price USD25.
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