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Focused Ion Beam as New Tool for Local Investigations of the Interaction of Microcracks with Grain Boundaries / M. Marx, W. Schaef, M. Welsch, H. Vehoff

Conference Author
Seventh International ASTM/ESIS Symposium on Fatigue and Fracture Mechanics (36th ASTM National Symposium on Fatigue and Fracture Mechanics) (7th : 2007 : Tampa, FL)
Physical Description
1 online resource (25 pages) : illustrations, figures, tables
Additional Creators
Welsch, M., Marx, M., Schaef, W., Vehoff, H., American Society for Testing and Materials, and ASTM International
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Summary
So far the interaction of microcracks with microstructural elements like grain boundaries or phase boundaries is described qualitatively well by the models of Tanaka and Navarro and De Los Rios. However, an experimentally verified quantitative description is missing due to a lack of systematic experiments. The concept by Marx and Schaef introduced a combination of a focused ion beam technique with high resolution scanning electron microscopy. It is the first method to initiate artificial microcracks with idealized crack parameters relative to selected phase and grain boundaries. This combination of characterizing and manipulating techniques on a microscale enables for the first time a systematic investigation of the interaction between short cracks and micro-structural barriers to check the models quantitatively. However, the geometry of the active slip planes in the adjacent grains, their misorientation angle, and the position of the grain boundary is a three-dimensional problem. Therefore the geometry was reconstructed after the crack propagation measurements by focused ion beam tomography to measure the inclination angles between the surface, the crack plane, and the grain boundary. The results should lead to a better understanding of the physical mechanisms of crack propagation through grain and phase boundaries, which is fundamental to explain the huge scatter in the short crack behavior and to develop materials with fatigue resistant grain boundaries.
Dates of Publication and/or Sequential Designation
Volume 2009, Issue 1508 (January 2009)
Subject(s)
Other Subject(s)
ISBN
9780803169999 (e-ISBN)
9780803134164
Digital File Characteristics
text file PDF
Bibliography Note
Includes bibliographical references 29.
Other Forms
Also available online via the World Wide Web. Tables of contents and abstracts freely available; full-text articles available by subscription.
Full text article also available for purchase.
Also available in PDF edition.
Reproduction Note
Electronic reproduction. W. Conshohocken, Pa. : ASTM International, 2009. Mode of access: World Wide Web. System requirements: Web browser. Access may be restricted to users at subscribing institutions.
Technical Details
Mode of access: World Wide Web.
Source of Acquisition
ASTM International PDF Purchase price USD25.
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