Value analysis tear-down : a new process for product development and innovation / Yoshihiko Sato and J. Jerry Kaufman

Author: Sato, Yoshihiko
Published: New York : Industrial Press : Society of Manufacturing Engineers, 2005.
Edition: 1st ed.
Physical Description: x, 206 pages : illustrations ; 24 cm
Additional Creators: Kaufman, J. Jerry

Browse Nearby on Shelf

Finding items...

Subject(s)

ISBN

0831132035 (professional/textbook : alk. paper)

Bibliography Note

Includes bibliographical references (page 199) and index.

Source of Acquisition

Engineering copy: Purchased with funds from the J. Harvey Fahnestock Endowment for Scientific, Engineering and Rare Books; 20045.

View MARC record | catkey: 2834309

Actions for Value analysis tear-down : a new process for product development and innovation