The VNA applications handbook / Gregory Bonaguide, Neil Jarvis
- Author
- Bonaguide, Gregory
- Published
- Norwood, MA : Artech House, [2019]
- Physical Description
- xiv, 375 pages : illustrations ; 23 cm
- Additional Creators
- Jarvis, Neil
- Contents
- Machine generated contents note: 1.1.What Is a Vector Network Analyzer? -- 1.2.Wave Quantities and S-Parameters -- 1.2.1.One-Port Measurements -- 1.2.2.Two-Port Measurements -- 1.3.Architecture of an N-Port Network Analyzer -- 1.3.1.Main Blocks -- 1.3.2.Errors -- 1.3.3.Test Set Challenges -- 1.4.Swept Versus Stepped Mode -- 1.4.1.Chopped Versus Alternate Mode -- 2.1.VNA Measurements in an Ideal World -- 2.2.Measurement Errors in the Real World -- 2.2.1.Random Errors -- 2.2.2.Systematic Errors -- 2.3.Calibration Standards -- 2.3.1.Open (O) -- 2.3.2.Short (S) -- 2.3.3.Match (M) -- 2.3.4.Sliding Match (Sliding Load) -- 2.3.5.Thru (T) -- 2.3.6.Reflect (R) -- 2.3.7.Line (L) -- 2.3.8.Symmetrical Network (N) -- 2.3.9.Attenuator Standard (A) -- 2.3.10.Unknown Thru (U) -- 2.4.Calibration Techniques -- 2.4.1.Normalization -- 2.4.2.Full Single-Port Correction (OSM) -- 2.4.3.One-Path, Two-Port Correction -- 2.4.4.Seven-Term Error Correction -- 2.4.5.12-Term Error Correction -- 2.5.Power Calibration -- 2.5.1.Source Power Calibration -- 2.5.2.Receiver Power Cal -- 2.5.3.SMARTerCal -- 2.5.4.Automatic Level Control (ALC) -- References -- Selected Bibliography -- 3.1.Passive One-Port Devices -- 3.1.1.Steps for Setting Up a Single-Port Measurement -- 3.1.2.Calibration for Multiple Single-Port Devices -- 3.1.3.Port Configuration for Multiple Simultaneous Single-Port Measurements -- 3.2.Impedance Measurements -- 3.2.1.Impedance Traces -- 3.2.2.Impedance Markers -- 3.3.Phase and Electrical Length Measurements -- 3.3.1.Calibration Offset Method -- 3.3.2.Group Delay Method -- 3.4.Measurement Uncertainty for Passive One-Port Devices -- 3.4.1.Directivity -- 3.4.2.Source Match -- 3.5.Active One-Port DUTs: Oscillators, VCOs, and Signal Generators -- 3.5.1.Spurious Signals -- 3.5.2.Heterodyne Images -- 3.5.3.Receiver Compression/Overload -- Reference -- Selected Bibliography -- Appendix 3A: Phase Wrap Resulting from an Offset Open or Offset Short Calibration Kit Standard -- Appendix 3A.2: MATLAB Script for Generating Data for Offset Open and Short Standards Versus Frequency -- 4.1.Passive Two-Port Devices -- 4.1.1.Steps for Establishing a Two-Port Measurement Baseline -- 4.1.2.Cable Measurements -- 4.1.3.Filter Measurements -- 4.1.4.Passive Multiport Devices Measured as a Two-Port -- 4.1.5.Switches: Time-Domain Transient Measurements -- 4.1.6.Phase and Delay-Matching of Complex-Modulated Signals -- Selected Bibliography -- 5.1.General-Purpose Amplifier Measurements -- 5.1.1.Linear Measurements -- 5.1.2.Nonlinear Measurements -- 5.2.High-Power Amplifier Measurements -- 5.2.1.Power Considerations for High-Power Calibration -- 5.2.2.Power Calibration for High-Power Applications -- 5.2.3.Adding an Attenuator to a Low-Power Sensor for High-Power Measurements -- 5.2.4.Hot S22 Measurements -- 5.3.High-Gain Amplifier Measurements -- 5.3.1.Attenuator Position Versus Coupler Design -- 5.3.2.Power Calibration Strategy -- 5.4.Low Noise Amplifier (LNA) Measurements -- 5.4.1.Noise Figure Theory -- 5.4.2.Y-Factor Method -- 5.4.3.Signal-to-Noise Method -- 5.4.4.Cold Source Method -- 5.4.5.Other Concerns -- References -- 6.1.Introduction -- 6.2.Mixer Architecture -- 6.2.1.Conversion Loss -- 6.2.2.Isolation -- 6.2.3.1-dB Compression Point -- 6.2.4.VSWR -- 6.2.5.Noise Figure -- 6.2.6.Dynamic Range -- 6.2.7.Single-Tone IMD -- 6.2.8.Multitone IMD -- 6.2.9.DC Polarity -- 6.2.10.DC Offset -- 6.3.Scalar Mixer Measurements -- 6.3.1.Scalar Mixer Setup (ZNB) -- 6.3.2.Scalar Mixer Calibration Steps -- 6.3.3.Scalar Mixer Measurement Steps -- 6.4.Mixer Phase Measurements with a VNA -- 6.4.1.Reference Mixer Method -- 6.4.2.Vector-Corrected Mixer Method -- 6.4.3.Simply Better Vector Mixer Measurements -- 6.5.Two-Tone Group Delay Measurements -- 6.5.1.Group Delay Measurements with the ZVA -- References -- 7.1.Pulse Measurement Introduction -- 7.1.1.Time-Domain Representation -- 7.1.2.Frequency-Domain Representation -- 7.2.VNA Pulsed Measurement Techniques -- 7.2.1.Pulse Averaging -- 7.2.2.Point-in-Pulse -- 7.2.3.Pulse Profile -- 7.3.Instrument Setups and Power Calibration Approaches for Pulse Measurements -- 7.3.1.Pulse Averaging Measurement Setup -- 7.3.2.Point-in-Pulse (Wideband) Measurement Setup -- 7.3.3.Pulse Profile Measurement Setup -- Appendix 7A: Fourier Analysis Review -- Appendix 7B: Odd and Even Functions -- 8.1.Introduction -- 8.1.1.Steps for Establishing a Single-Port TDR Measurement Baseline -- 8.1.2.Time-Domain Basics -- 8.1.3.Time-Domain Gating -- 8.1.4.Cable Measurements -- 8.1.5.PCB Measurements -- 8.1.6.Advanced De-Embedding Tools -- 8.1.7.DUTs with Pigtails -- 8.2.Best Practices -- 8.2.1.Device Characteristics -- 8.2.2.VNA Settings -- 8.2.3.Correlations Between Frequency Domain and Time Domain -- 9.1.Introduction -- 9.2.On-Wafer Measurements -- 9.2.1.Power Calibration -- 9.3.Over-the-Air Measurements -- 9.4.Millimeter-Wave Converters -- 9.4.1.Millimeter-Wave Converter Architecture -- 9.4.2.Millimeter-Wave Converter Applications -- 9.4.3.Waveguide Calibration -- 9.4.4.VNA-Based Spectrum Analysis -- References -- 10.1.Signal Integrity (SI) -- 10.1.1.Steps for Establishing a Four-Port Differential Measurement Baseline -- 10.1.2.SI Basics -- 10.1.3.Eye Diagrams -- 10.2.Power Integrity -- 10.3.Reciprocity -- 10.4.Passivity -- 10.5.Causality -- 10.6.2x Thru De-Embedding -- 10.7.Delta L -- 10.8.PCB Probing -- Reference.
- Subject(s)
- ISBN
- 9781630816001 hardcover
1630816000 hardcover - Bibliography Note
- Includes bibliographical references and index.
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