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Fringe pattern analysis for optical metrology [electronic resource] : theory, algorithms, and applications / Manuel Servin, J. Antonio Quiroga, and J. Moisâes Padilla

Author
Servin, Manuel
Published
Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA, [2014]
Physical Description
xvi, 327 pages : illustrations ; 25 cm
Additional Creators
Quiroga, J. Antonio and Padilla, J. Moisâes
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ISBN
9783527411528
Bibliography Note
Includes bibliographical references and index.
View MARC record | catkey: 33536890