X-Ray Microscopy and Spectromicroscopy [electronic resource] : Status Report from the Fifth International Conference, Würzburg, August 19-23, 1996 / edited by Jürgen Thieme, Günter Schmahl, Dietbert Rudolph, Eberhard Umbach
- Published
- Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 1998.
- Edition
- 1st ed. 1998.
- Physical Description
- XIX, 383 pages 400 illustrations : online resource
- Additional Creators
- Thieme, Jürgen, Schmahl, Günter, Rudolph, Dietbert, Umbach, Eberhard, and SpringerLink (Online service)
Access Online
- Contents
- X-Ray Microscopy Projects -- X-Ray Microscopy Applications -- Microspectroscopy and Spectromicroscopy -- X-Ray Optics -- X-Ray Sources.
- Summary
- This book contains state-of-the-art reviews and up-to-date progress reports in the field of X-ray microscopy and spectromicroscopy, including related new X-ray optics and X-ray sources. It reflects the lively activities in a relatively new field of science which combines the development of new instruments and methods with their applications to numerous topical scientific questions. The applications range from biological and medical topics, colloid physics, and soil sciences to solid-state physics, material sciences, and surface sciences. The book appeals to researchers who are active in microscopic and spectromicroscopic studies.
- Subject(s)
- ISBN
- 9783642721069
- Digital File Characteristics
- PDF
text file - Part Of
- Springer Nature eBook
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