High Performance Memory Testing [electronic resource] : Design Principles, Fault Modeling and Self-Test / by R. Dean Adams

Author:: Adams, R. Dean
Published:: New York, NY : Springer US : Imprint: Springer, 2003.
Edition:: 1st ed. 2003.
Physical Description:: XIV, 250 pages : online resource
Additional Creators:: SpringerLink (Online service)

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Series:

Frontiers in Electronic Testing, 0929-1296 ; 22A

Contents:

Test of Memories -- Opening Pandora's Box -- Static Random Access Memories -- Multi-Port Memories -- Silicon On Insulator Memories -- Content Addressable Memories -- Dynamic Random Access Memories -- Non-Volatile Memories -- Memory Testing -- Memory Faults -- Memory Patterns -- Memory Self Test -- BIST Concepts -- State Machine BIST -- Micro-Code BIST -- BIST and Redundancy -- Design For Test and BIST -- Conclusions.

Summary:

Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.

Subject(s):

ISBN:

9780306479724

Digital File Characteristics:

PDF
text file

Part Of:

Springer Nature eBook

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